Equipment

Scanning electron microscope

Merlin

Field Emission Scanning Electron Microscope (FE-SEM) with energy-dispersive X-ray spectroscopy (EDS), local charge compensation.

Scanning electron microscope

EVO LS 10

Conventional scanning electron microscope for wide range of life science samples with Variable and Extended pressure modes and energy dispersive spectrometer

Scanning electron/ion microscope

Auriga CrossBeam Workstation

Study of morphology, chemical, and structural material properties with nanoscale resolution. Field Emission Scanning Electron Microscope (FE-SEM) with focused ion beam (FIB), electron backscatter diffraction (EBSD), energy-dispersive X-ray spectroscopy (EDS), local charge compensation, and E-beam lithography.

Scanning electron microscope

VEGA 3 SBH

Scanning probe microscope

Asylum MFP 3D SA

Highest sensitivity, broad spectra of local electrical measurements. Micro- and nano- relief of the surface; Conductivity and spreading resistance; Work function of electrons; Spatial distribution of surface potential; Electromechanical properties; Spatial distribution of magnetic properties

Scanning probe microscope

NanoScan-4D

Measuring of hardness and elastic module by nanoindentation and surface topography on nanometer scale.

Scanning probe nanolaboratory

NTEGRA Aura

Measurements in vacuum and controlled atmosphere. Piezo-response force microscopy; Contact scanning capacitance microscopy; Atomic-force acoustic microscopy; Measurements in liquid; Sample heating.

Scanning probe nanolaboratory

NTEGRA Therma

Scanning probe nanolaboratory

NTEGRA Prima

Probe nanolaboratory

NTEGRA Spectra

Integration of scanning probe microscopy with confocal microscopy and Raman spectroscopy