Alpha 300 AR
Nondestructive chemical analysis and surface relief mapping. Confocal microscopy in reflected light; Fluorescent and Raman spectroscopy; 3D layer mapping
Manufacturer: WiTec
Year: 2012
Olympus BX61 TRF
Wide range of optical microscopy investigations with automatic image analysis. Fully motorized
Manufacturer: Olympus
Year: 2011
WYKO NT1100
Noncontact fast measurements of surface topography from nanometer scale roughness through millimeter scale steps
Manufacturer: Veeco
Year: 2006
Kestrel-200 Peregrine
Wide range of fast and accurate non-contact 2-axis measurements
Manufacturer: Vision Engineering
Year: 2010
7407 VSM
Measurements of magnetic moments of bulk and thin film samples
Manufacturer: Lake Shore Cryotronics, USA
Year: 2013
Agilent Cary 5000
Measurements of absorbance and reflectance at specific wavelengths or over a range for absolute or relative comparisons of solid and liquid samples
Manufacturer: Agilent Technologies Inc., USA
Year: 2013
TF Analyser 2000
Measurement and analysis of ferroelectric, piezoelectric, pyroelectric and dielectric properties in thin films and bulk materials
Manufacturer: aixACCT, Germany
Year: 2012
ATC ORION 8 UHV
Sputtering of multilayer and composite metal, dielectric and magnetic films
Manufacturer: AJA International, USA
Year: 0
Auto 500 Edwards
Deposition of metal and dielectric thin films by electron-beam evaporation and DC/RF magnetron sputtering
Manufacturer: BOC Edw., United Kingdom
Year: 2007
Bruker EMX Plus
Continuous wave detection Electron Spin Resonance (EPR) and Electron-Nuclear-Double Resonance (ENDOR) at frequencies up to 100 Mhz
Manufacturer: Bruker, Germany
Year: 2006