LECO TruSpec MICRO
The TruSpec Micro delivers optimal performance in carbon, hydrogen, nitrogen and sulfur determination in solid micro samples. Analytical range at nominal sample mass of 2 mg: carbon 0,002 - 100%; hydrogen 0,02 - 50%; nitrogen 0,02 - 50%; sulfur 0,04 - 65%/
Manufacturer:
LECO
Year: 2020
Surface Area Analyzer and Pore Size Analyzer Quadrasorb SI
The automatic Surface Area and Porosity Analyzer QUADRASORB SI carries out the fast highly exact analysis of surface area of a sample by the BET method, the volume of pores by the BJH method, and also detailed pore size distributions due to the full adsorption and desorption capability.
Manufacturer:
Quantachrome Instruments A brand of Anton Paar 1900 Corporate Drive Boynton Beach, FL 33426 USA
Year: 2011
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Integration of atomic force microscopy (AFM) techniques with Raman spectroscopy techniques. The system is designed for research in an inert atmosphere with nanometer resolution and provides comprehensive data on multiple surface properties of the sample, such as: topography, magnetization, electric potential and work function, friction force, piezoresponse, elasticity, capacitance, leakage current, and much more.
The Federal Joint Research Center "Material Science and Characterization in Advanced Technology”, Russia
D2 Phaser
Powder X-ray diffractometry, X-ray phase analysis
The Federal Joint Research Center "Material Science and Characterization in Advanced Technology”, Russia
Manufacturer:
Bruker
Globus-M
A next-generation spherical tokamak designed to study physical processes in spherical plasma configurations and to develop engineering solutions for megaampere-range spherical tokamaks.
The Federal Joint Research Center "Material Science and Characterization in Advanced Technology”, Russia
JEM-2100F
Local analysis of structure, atomic composition, and bonding using high-resolution transmission electron microscopy (HRTEM) and microanalysis.
The Federal Joint Research Center "Material Science and Characterization in Advanced Technology”, Russia
Manufacturer:
JEOL
D8 Discover
High-resolution X-ray diffractometry
The Federal Joint Research Center "Material Science and Characterization in Advanced Technology”, Russia
Manufacturer:
Bruker
JSM-7001F
Designed for electron beam lithography and high-resolution scanning electron microscopy (SEM). Capabilities include microstructural analysis: texture analysis, crystallite orientation mapping, phase discrimination and crystalline phase distribution mapping, grain size and shape determination, boundary type analysis, and pole figure construction.
The Federal Joint Research Center "Material Science and Characterization in Advanced Technology”, Russia
Manufacturer:
JEOL
SMZ 745T
Optical microscopy with digital imaging
The Federal Joint Research Center "Material Science and Characterization in Advanced Technology”, Russia
Manufacturer:
Nikon
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Studies using deep-level transient spectroscopy (DLTS) and admittance spectroscopy across a broad temperature range
The Federal Joint Research Center "Material Science and Characterization in Advanced Technology”, Russia