Russia
Electron Microscopy Scanning electron microscope
Merlin
Field Emission Scanning Electron Microscope (FE-SEM) with energy-dispersive X-ray spectroscopy (EDS), local charge compensation.
Manufacturer: Carl Zeiss
Year: 2016
Electron Microscopy Scanning electron microscope
EVO LS 10
Conventional scanning electron microscope for wide range of life science samples with Variable and Extended pressure modes and energy dispersive spectrometer
Manufacturer: Carl Zeiss
Year: 2014
Electron Microscopy Scanning electron/ion microscope
Auriga CrossBeam Workstation
Study of morphology, chemical, and structural material properties with nanoscale resolution. Field Emission Scanning Electron Microscope (FE-SEM) with focused ion beam (FIB), electron backscatter diffraction (EBSD), energy-dispersive X-ray spectroscopy (EDS), local charge compensation, and E-beam lithography.
Manufacturer: Carl Zeiss
Year: 2009
Electron Microscopy Scanning electron microscope
VEGA 3 SBH
Manufacturer: Tescan
Year: 2020
Probe Microscopy Scanning probe microscope
Asylum MFP 3D SA
Highest sensitivity, broad spectra of local electrical measurements. Micro- and nano- relief of the surface; Conductivity and spreading resistance; Work function of electrons; Spatial distribution of surface potential; Electromechanical properties; Spatial distribution of magnetic properties
Manufacturer: Asylum Research
Year: 2013
Probe Microscopy Scanning probe microscope
NanoScan-4D
Measuring of hardness and elastic module by nanoindentation and surface topography on nanometer scale.
Manufacturer: Technology Institute for Superhard and New Carbon Materials, Russia
Year: 2014
Probe Microscopy Scanning probe nanolaboratory
NTEGRA Aura
Measurements in vacuum and controlled atmosphere. Piezo-response force microscopy; Contact scanning capacitance microscopy; Atomic-force acoustic microscopy; Measurements in liquid; Sample heating.
Manufacturer: NT-MDT, Russia
Year: 2007
Probe Microscopy Scanning probe nanolaboratory
NTEGRA Therma
Manufacturer: NT-MDT, Russia
Year: 2007
Probe Microscopy Scanning probe nanolaboratory
NTEGRA Prima
Manufacturer: NT-MDT, Russia
Year: 2007
Confocal Microscopy Probe nanolaboratory
NTEGRA Spectra
Integration of scanning probe microscopy with confocal microscopy and Raman spectroscopy
Manufacturer: NT-MDT, Russia
Year: 2007