Equipment


Russia

Electron Microscopy Scanning electron microscope

Merlin

Field Emission Scanning Electron Microscope (FE-SEM) with energy-dispersive X-ray spectroscopy (EDS), local charge compensation.

Manufacturer: Carl Zeiss

Year: 2016

Electron Microscopy Scanning electron microscope

EVO LS 10

Conventional scanning electron microscope for wide range of life science samples with Variable and Extended pressure modes and energy dispersive spectrometer

Manufacturer: Carl Zeiss

Year: 2014

Details

Electron Microscopy Scanning electron/ion microscope

Auriga CrossBeam Workstation

Study of morphology, chemical, and structural material properties with nanoscale resolution. Field Emission Scanning Electron Microscope (FE-SEM) with focused ion beam (FIB), electron backscatter diffraction (EBSD), energy-dispersive X-ray spectroscopy (EDS), local charge compensation, and E-beam lithography.

Manufacturer: Carl Zeiss

Year: 2009

Details

Electron Microscopy Scanning electron microscope

VEGA 3 SBH

Manufacturer: Tescan

Year: 2020

Probe Microscopy Scanning probe microscope

Asylum MFP 3D SA

Highest sensitivity, broad spectra of local electrical measurements. Micro- and nano- relief of the surface; Conductivity and spreading resistance; Work function of electrons; Spatial distribution of surface potential; Electromechanical properties; Spatial distribution of magnetic properties

Manufacturer: Asylum Research

Year: 2013

Details

Probe Microscopy Scanning probe microscope

NanoScan-4D

Measuring of hardness and elastic module by nanoindentation and surface topography on nanometer scale.

Manufacturer: Technology Institute for Superhard and New Carbon Materials, Russia

Year: 2014

Details

Probe Microscopy Scanning probe nanolaboratory

NTEGRA Aura

Measurements in vacuum and controlled atmosphere. Piezo-response force microscopy; Contact scanning capacitance microscopy; Atomic-force acoustic microscopy; Measurements in liquid; Sample heating.

Manufacturer: NT-MDT, Russia

Year: 2007

Details

Probe Microscopy Scanning probe nanolaboratory

NTEGRA Therma

Manufacturer: NT-MDT, Russia

Year: 2007

Probe Microscopy Scanning probe nanolaboratory

NTEGRA Prima

Manufacturer: NT-MDT, Russia

Year: 2007

Confocal Microscopy Probe nanolaboratory

NTEGRA Spectra

Integration of scanning probe microscopy with confocal microscopy and Raman spectroscopy

Manufacturer: NT-MDT, Russia

Year: 2007

Details