Equipment

Merlin

Field Emission Scanning Electron Microscope (FE-SEM) with energy-dispersive X-ray spectroscopy (EDS), local charge compensation.

EVO LS 10

Conventional scanning electron microscope for wide range of life science samples with Variable and Extended pressure modes and energy dispersive spectrometer

Details

Auriga CrossBeam Workstation

Study of morphology, chemical, and structural material properties with nanoscale resolution. Field Emission Scanning Electron Microscope (FE-SEM) with focused ion beam (FIB), electron backscatter diffraction (EBSD), energy-dispersive X-ray spectroscopy (EDS), local charge compensation, and E-beam lithography.

Details

VEGA 3 SBH

Asylum MFP 3D SA

Highest sensitivity, broad spectra of local electrical measurements. Micro- and nano- relief of the surface; Conductivity and spreading resistance; Work function of electrons; Spatial distribution of surface potential; Electromechanical properties; Spatial distribution of magnetic properties

Details

NanoScan-4D

Measuring of hardness and elastic module by nanoindentation and surface topography on nanometer scale.

Details

NTEGRA Aura

Measurements in vacuum and controlled atmosphere. Piezo-response force microscopy; Contact scanning capacitance microscopy; Atomic-force acoustic microscopy; Measurements in liquid; Sample heating.

Details

NTEGRA Therma

NTEGRA Prima

NTEGRA Spectra

Integration of scanning probe microscopy with confocal microscopy and Raman spectroscopy

Details