Equipment


Russia



Technological equipment
Ion beam thinning system

Nanomill 1050

Sample preparation for transmission electron microscopy (TEM)

The Federal Joint Research Center "Material Science and Characterization in Advanced Technology”, Russia

Manufacturer:
Fischione Instruments

Optical Microscopy
Stereoscopic microscope with digital imaging system

Eclipse L150

Optical microscopy with digital imaging

The Federal Joint Research Center "Material Science and Characterization in Advanced Technology”, Russia

Manufacturer:
Nikon

Spectrometry
Secondary ion mass spectrometer (SIMS)

IMS-7f

For measuring the mass of secondary ions generated during layer-by-layer sputtering of the sample by a primary ion beam. The instrument is used for implantation dose monitoring, p-n junction depth profiling, process development, and depth-resolved elemental analysis in materials science, microelectronics, semiconductor technology, geology, biology, medicine, and metallurgy.

The Federal Joint Research Center "Material Science and Characterization in Advanced Technology”, Russia

Manufacturer:
Cameca

Technological equipment
Specialized high-vacuum setup for investigating low-dose ion modification of tungsten

STE IBS

Designed for studying low-dose and low-energy ion modification of tungsten near-surface layers

The Federal Joint Research Center "Material Science and Characterization in Advanced Technology”, Russia

Spectrometry
Fourier-transform infrared spectrometer (FTIR spectrometer)

FT-801

Molecular composition analysis, substance concentration measurement, sample quality control, and investigation of chemical reaction kinetics.

The Federal Joint Research Center "Material Science and Characterization in Advanced Technology”, Russia

Manufacturer:
Simex

Year: 2021