Manual Contact Mask Aligner
SUSS MJB4
Alignment of photomask with wafer and resist exposition for contact lithography
Ural Center for Shared Use "Modern Nanotechnologies", Russia
Manufacturer:
Suss MicroTec, Germany
Year: 2007
SUSS MJB4
Alignment of photomask with wafer and resist exposition for contact lithography
Ural Center for Shared Use "Modern Nanotechnologies", Russia
Manufacturer:
Suss MicroTec, Germany
Year: 2007
iCAP 6500 Duo
Quantitative and qualitative elemental analysis with simultaneous detection of up to 40 elements
Ural Center for Shared Use "Modern Nanotechnologies", Russia
Manufacturer:
Thermo Scientific, USA
Year: 2006
Solaar M6
Qualitative elemental analysis of different samples for inorganic components
Ural Center for Shared Use "Modern Nanotechnologies", Russia
Manufacturer:
Thermo Scientific, USA
Year: 2006
TriStar 3000
High-quality surface area and porosimetry measurements on solid materials by using the technique of gas adsorption and desorption
Ural Center for Shared Use "Modern Nanotechnologies", Russia
Manufacturer:
Micromeritics, USA
Year: 2007
VL-300/40
Laser marking, engraving, and cutting of wide range of materials
Ural Center for Shared Use "Modern Nanotechnologies", Russia
Manufacturer:
Laser Technology Center, St.-Petersburg, Russia
Year: 2008
Waters Xevo QTOF
Quadrupole (Q) and time-of-flight (Tof) high resolution mass spectrometer
Ural Center for Shared Use "Modern Nanotechnologies", Russia
Manufacturer:
Waters Corporation, USA
Year: 2010
SPS-515S
Equipment for processing and transformation of substances and materials / Thermal equipment / Installations and devices for electric heating, calcination and melting / Specialized melting equipment / Specialized equipment for melting non-metallic materials
Manufacturer:
Syntex Inc.
Year: 2008
XtaLAB Synergy-S
Diffractometer is designed for diffraction experiments with single crystals of chemical substances (inorganic, organic or organo-metallic), mineralogical and biological samples. The experimental data are used to determine the atomic structure of crystals (unit cell parameters, spatial symmetry, atomic coordinates, atomic thermal oscillation parameters, electron density distribution) over a wide temperature range.
Testing Center of Nanotechnology and Advanced Materials, Russia
Manufacturer:
Rigaku Oxford Diffraction, Japan.
Year: 2021
STA449F3 Jupiter
Principle of operation: measurement of sample mass variation with temperature or composition of gas environment. Combined thermal TG, TGA-DTA and TGA-DSC analyzer. Permits to record simultaneously variation of mass of a sample and the processes accompanied by the release or absorption of heat.
Testing Center of Nanotechnology and Advanced Materials, Russia
Manufacturer:
Netzsch, Germany
Year: 2019
Instron 5982
Designed for measuring mechanical properties when testing for tension, compression, three-point bending.
Testing Center of Nanotechnology and Advanced Materials, Russia
Manufacturer:
Instron, UK
Year: 2010