microhardness meter
Qness 10 А+
Designed to measure the microhardness of metals and alloys according to Vickers and Knoop
Testing Center of Nanotechnology and Advanced Materials, Russia
Manufacturer:
Qness GmbH Austria
Year: 2021
Qness 10 А+
Designed to measure the microhardness of metals and alloys according to Vickers and Knoop
Testing Center of Nanotechnology and Advanced Materials, Russia
Manufacturer:
Qness GmbH Austria
Year: 2021
MPMS-XL-5
Testing Center of Nanotechnology and Advanced Materials, Russia
Manufacturer:
Quantum Design, USA
Year: 1996
7407 VSM
The vibrating sample magnetometer 7407 VSM is to carry magnetic measurements of bulk, powder, and film samples
Testing Center of Nanotechnology and Advanced Materials, Russia
Manufacturer:
Lake Shore Cryotronics, USA
Year: 2012
The unit is designed to measure mechanical properties at the nanoscale. It is equipped with an automated three-coordinate sample platform with a system for eliminating engine backlash to ensure high reproducibility of positioning.
Testing Center of Nanotechnology and Advanced Materials, Russia
Manufacturer:
\"Micro Materials Ltd\", UK
Year: 2009
ICPE9000
Vacuum ICP spectrometer with temperature-controlled Echelle optics. Provides qualitative and precise quantitative analysis without pre-setting the analytical lines.
Testing Center of Nanotechnology and Advanced Materials, Russia
Manufacturer:
Shimadzu, Japan
Year: 2012
UV-mini-1240
Designed to determine the spectral composition of substances
Testing Center of Nanotechnology and Advanced Materials, Russia
Manufacturer:
Shimadzu, Japan
Year: 2005
IO 5003-0,3-11
Designed for testing samples of metals and alloys for double-support impact bending in accordance with GOST (state russian standard) 9454-78.
Testing Center of Nanotechnology and Advanced Materials, Russia
Manufacturer:
LLC “Testing Instruments Plant” (LLC “ZIP”), Russia
Year: 2021
Tecnai G2 30 Twin
Designed to study the atomic-crystalline and amorphous structure of inorganic, organic, metallic, ceramic, and biological objects, with high spatial resolution up to atomic one. The microscope is equipped with electron beam scanning systems, \"GATAN\" image mapping, electron energy loss spectroscopy \"EELS\" unit, and the \"EDAX\" energy dispersion spectrometer for chemical elemental analysis. It is also equipped with a set of units for in situ heating, cooling, and deformation.
Testing Center of Nanotechnology and Advanced Materials, Russia
Manufacturer:
\"FEI\", The Netherlands
Year: 2005
SmartLab Se Rigaku
X-ray diffraction analysis of polycrystalline materials and thin film
Manufacturer:
Rigaku Corporation
Year: 2020
Supra 50V
High Resolution Field Emission Scanning Electron Microscope (FE-SEM) with energy-dispersive X-ray spectroscopy (EDS), local charge compensation.
Manufacturer:
Carl Zeiss
Year: 2005