The XtaLAB Synergy-S monocrystal diffractometer with microfocus X-ray sources

XtaLAB Synergy-S

Diffractometer is designed for diffraction experiments with single crystals of chemical substances (inorganic, organic or organo-metallic), mineralogical and biological samples. The experimental data are used to determine the atomic structure of crystals (unit cell parameters, spatial symmetry, atomic coordinates, atomic thermal oscillation parameters, electron density distribution) over a wide temperature range.

Synchronous thermal analyzer

STA449F3 Jupiter

Principle of operation: measurement of sample mass variation with temperature or composition of gas environment. Combined thermal TG, TGA-DTA and TGA-DSC analyzer. Permits to record simultaneously variation of mass of a sample and the processes accompanied by the release or absorption of heat.

Testing machine Instron 5982

Instron 5982

Designed for measuring mechanical properties when testing for tension, compression, three-point bending.

microhardness meter

Qness 10 А+

Designed to measure the microhardness of metals and alloys according to Vickers and Knoop

SQUID Magnetometer:Magnetic Property Measurement System

MPMS-XL-5

Vibrating sample magnetometer 7407 VSM based on water-cooled electromagnet

7407 VSM

The vibrating sample magnetometer 7407 VSM is to carry magnetic measurements of bulk, powder, and film samples

\"NanoTest-600\"

The unit is designed to measure mechanical properties at the nanoscale. It is equipped with an automated three-coordinate sample platform with a system for eliminating engine backlash to ensure high reproducibility of positioning.

Parallel optical spectrometer with inductively coupled plasma (ICP)

ICPE9000

Vacuum ICP spectrometer with temperature-controlled Echelle optics. Provides qualitative and precise quantitative analysis without pre-setting the analytical lines.

Spectrophotometer UV-mini-1240

UV-mini-1240

Designed to determine the spectral composition of substances

Pendulum pile driver IO 5003-0,3-11 type

IO 5003-0,3-11

Designed for testing samples of metals and alloys for double-support impact bending in accordance with GOST (state russian standard) 9454-78.

Transmission electron microscope Tecnai G2 30 Twin

Tecnai G2 30 Twin

Designed to study the atomic-crystalline and amorphous structure of inorganic, organic, metallic, ceramic, and biological objects, with high spatial resolution up to atomic one. The microscope is equipped with electron beam scanning systems, \"GATAN\" image mapping, electron energy loss spectroscopy \"EELS\" unit, and the \"EDAX\" energy dispersion spectrometer for chemical elemental analysis. It is also equipped with a set of units for in situ heating, cooling, and deformation.