Russia
Institute of Solid State Physics RAS
Equipment
Diffractometer
SmartLab Se Rigaku
X-ray diffraction analysis of polycrystalline materials and thin film
Manufacturer:
Rigaku Corporation
Year: 2020
Scanning electron microscope Supra 50V
Supra 50V
High Resolution Field Emission Scanning Electron Microscope (FE-SEM) with energy-dispersive X-ray spectroscopy (EDS), local charge compensation.
Manufacturer:
Carl Zeiss
Year: 2005
Electron Microscope System Versa 3D
Versa 3D
The Versa 3D DualBeam system provides high-resolution, three-dimensional imaging on a range of sample types. Versa 3D is available with either high-vacuum-only or high- and low-vacuum electron imaging hardware. New features, such as FEI’s SmartSCAN and Drift Corrected Frame Integration (DCFI), facilitate electron beam imaging of sample types with a range of different properties. Advanced backscattered electron, as well as secondary electron and ion detectors, collect topographic, elemental, and compositional information from a variety of angles
Manufacturer:
FEI Company
Year: 2012
OMICRON VT AFM XA Scanning Probe Microscope
OMICRON VT AFM XA
Highest sensitivity, broad spectra of local electrical measurements. Micro- and nano- relief of the surface. Conductivity and spreading resistance. Work function of electrons; Spatial distribution of surface potential.
Manufacturer:
OMICRON nanotechnology GmbH
Year: 2009
Time-of-Flight Secondary Ion Mass Spectrometer
TOF.SIMS.5 (ION-TOF)
The TOF-SIMS5 is a highly sensitive surface analytical technique, using a pulsed and focused ion beam and time-of-flight analyzer to produce positive and negative mass spectra and mass spectral images from the outer 1 to 2nm of materials
Manufacturer:
ION-TOF
Year: 2006
VERTEX 80V FTIR SPECTROMETER
VERTEX 80V
The VERTEX 80V FTIR is for Transmition, Reflection and Photoluminescence spectra.
Manufacturer:
Bruker
Year: 2011
Kratos Axis Ultra DLD X-ray/Ultraviolet Photoelectron Spectrometer
Kratos Axis Ultra DLD
X-ray photoelectron spectroscopy and imaging/ Monochromatic Al x-ray source Achromatic Mg/Al X-ray sources Small spot analysis ~15 μm Ultraviolet Photoelectron Spectroscopy LEED He(I) and He(II) UV source Low Energy Ion Scattering Spectroscopy He ion beam source Auger Electron Spectroscopy and Imaging Field emission electron source
Manufacturer:
Kratos
Year: 2011
Test Machine
UTS111.2-50-22
Automatic-mode construction of deformation curves in standard coordinates and determination of the following mechanical characteristics of materials in the state of stretching or compression: fluidity limit, tensile strength, strengthening coefficient, bending strength Load range: 5 — 50 kN, temperature range: r.t.-1250 C
Manufacturer:
Test-systems, Russia
Year: 2021
Test Machine
VTI 2300-50-0,5
Carrying out mechanical tests for stretching and compression of various materials
Manufacturer:
Test-systems, Russia
Year: 2023
Reactive Ion Etching System
Plasmalab System 100
Plasma reactive ion etching of metals, Si and Si compounds, and dielectrics
Manufacturer:
Oxford Instruments, United Kingdom
Year: 2014